SDI Semiconductor Instruments Group , a leading used equipment
brokerage, has the following "State of the art" Goniometer for sale on
behalf of it's USA based clients:

Manufacturer: Rigaku
Model: ATX-E
Type: High-resolution Diffractometer for thin film measurements
Wafer size: Up to 8 inch
Age: 2001
Still Installed
Condition: Excellent, operational
Sales conditions: AS IS, WHERE IS
Location: USA
Parts included:
ATX-E Hi-resolution goniometer,
ANPM Parabolic multilayer mirror,
A4057B3 Sealed tube X-ray generator,
A4253A1 Radiation enclosure,Tube support,
A4006Z1 Horizontal Tube shield, High voltage cable and X-ray Tube,
A4610K4 Incident Optical system and X-ray optical system alignment s/w,
A5738E2 Scintillation counter detector, control and measurement
software,CrystalGuide Software,
A9240H141 Rocking curve simulation s/w,reciprocal map texture display
s/w,
A9T51B0032G03 Transformer,
AATP-FF-CUL X-ray tube,
AATX-E-COMPXTL Beam width compression crystal monochromator,
AATX-TOPOG Topography option,
AREFL-NODS Reflectivity analysis without diffuse scattering simulation,
AATX-BOND Attachment for bond method including s/w,
AATX-ANAXTL 2 -bounce analyser crystal for reciprocal map measurements,
ACP-M17-20128W Instrument controller,
ARW-100-ACN 2.8kW Heat exchanger
Description:
3KW hi resolution x-ray diffraction system for TF analysis with an
encoder for the omega 2 theta axis.Use of monochromatic X rays from a 4
bounce crystal monochromator enables the measurement of rocking curves
and reciprocal lattice maps with high resolution. Computer control of 14
axees which enables the reconfiguration and readjustment of the optics
through software.Reciprocal space measurements are made easy by
one-touch receiving slit exchange and optional analyzer.Reflectivity
measurements can be made to determine film thickness density and
roughness. Rigaku CrystalGuide software enables the user to click on a
graphical representation of the reciprocal lattice space and the ATX-E
will automatically seek the Bragg reflection of interest.In addition to
a library of lattice parameters of typical crystal substrates,
CrystalGuide can auto-search the substrate crystal orientation.Wafers up
to 8 inches can be measured.Area mapping can be made over a 104 X 104 mm
region.

For more details or a quote, please contact:

Stephen Howe
SDI Semiconductor Instruments Srl
Via Rocco Galdieri, 6
Napoli 80123
Italy
Tel: Italy (39) 081 240 3469
Mobile: Italy (39) 335 710 7756
Fax Italy (39) 081 240 3950
[email protected]

Oliver Dunne
SDI Semiconductor Instruments Ireland Limited
Tel: Ireland (353) 46 943 8804
Mobile: Ireland (353) 872 985 561
Fax: Ireland (353) 46 943 8805
[email protected]

David Lee
SDI Semiconductor Instruments Inc.
491 Skyline Dr.
Woodland Park, CO 80863
USA
719-229-6066 (phone)
775-262-0409 (fax)
[email protected]

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