A MEMS Clearinghouse® and information portal
for the MEMS and Nanotechnology community
RegisterSign-In
MEMSnet Home About Us What is MEMS? Beginner's Guide Discussion Groups Advertise Here
News
MEMSnet Home: MEMS-Talk: Internal Stress Release Thermal Oxidation
Internal Stress Release Thermal Oxidation
2005-05-13
Eric Dy
Internal Stress Release Thermal Oxidation
Eric Dy
2005-05-13
I grew 1.5micron of oxide on a bare silicon wafer using LPCVD at 1100degC.
I need to reduce the residual stress within this film in order to prevent
buckling of the beams I will be etching into the film.  There is a
compressive stress of approximately 70MPa.  Does anyone know at what
temperature and for how long I should anneal?  I'm thinking I need to anneal
at no less than 1300degC.  Thanks for the assistance.

Eric
reply
Events
Glossary
Materials
Links
MEMS-talk
Terms of Use | Contact Us | Search
MEMS Exchange
MEMS Industry Group
Coventor
Harrick Plasma
Tanner EDA
Addison Engineering
Harrick Plasma, Inc.
The Branford Group
Process Variations in Microsystems Manufacturing