Hello Everyone:

I am trying to perform characterization on diamond films in
terms of thickness and I having some issues measuring the
thickness of the films across the wafer.  The main problem
that I am having is that I do not know the index of
refraction of the diamond film.  I was wondering if someone
knows about any method or company able to measure the value
of n for a specific material.  So far, I have tried the
elipsometer but since I do not know the thickness and
neither the index of refraction I am having wrong
measurements.

I will appreciate any idea or suggestion.

Thanks in advance;

Eric J. Correa Rivera
Graduate Student
Mechanical Engineering
University of Illinois at Urbana Champaign