Hi Ho Yin Chan,

there are million of devices out there, since the task you described is
one of the standards you have to do since the earliest age of
semiconductors manufacturing. And since engineers are lazy but clever
the developed hundreds of devices how makes there lives easier.
Please check the big manufactors of measurement. We use a device from
Agilent. Keithley is another manufactor I remember just now. I'm pretty
sure there are dozens more companies out there.  Just google for
"semiconductor characterization system" will end up with more then 1.5
million results.

However, if you like to characterise your transistors on the substrat
(wafer) level you have to think about buying a prober as well which you
need to create the desired contact from the bond pads to the measurement
system.
All in all it is very expensive (200.000 dollars or more) and will
definitely not fit into your normal lab-budget. If so, please give me
the address of your lab for my applications ;)

Best regards

Torsten

Ho Yin Chan wrote:

> Hi all,
> I am looking for measurement kit/device for measuring the
> characteristic of a fabricated transistor. I wonder how people do the
> measurements. For example, dI/dV vs Vg, Ids vs Vg measurements. Is
> there any device for taking these? Or do we need to calculate the
> derivative by ourselves after taking the I-V measurement? Can you
> suggest me a model and brand for the certain measurement device?