Dear sirs,

In the design of cantilever beams and doubly-supported beams many authors
have been used interferometric techniques to measure the deflection of
those microestructures. Could anyone E-mail me where I can buy an
optical microscope to measure vertical deflection?

Thanks in advance

Dr. F. Sandoval-Ibarra
Microelectronics Laboratory
INAOE, Puebla (Mexico)
Phone: + 52 (22) 47 20 11
Fax: + 52 (22) 47 05 17