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MEMSnet Home: MEMS-Talk: Re: minute force or pressure measurement
Re: minute force or pressure measurement
1999-04-24
Wen H. Ko
Re: minute force or pressure measurement
Wen H. Ko
1999-04-24
You may:
1. use a calibrated cantilever beam as the probe and measure the deflection
and calculate the force.

2. use a weight ,mili or microgram, to load the cantilever and measure the
deflection.


At 02:52 PM 3/23/99 -0600, you wrote:
>I am working on the deflection measurement with an application of load in
>the range of mili-newton. The cantilever thin film is deflected by a
>probe. The deflection can be measured by a build-in micrometer. Now I am
>seeking a method to measure the contact force. The PZT tranceducer(or
>force sensor) is considered to be used. However, since the size of the
>thin film as well as the tip of the probe is very small(in the order of 50
>micrometers), I do not know how to mount the PZT.
>Does anyone know how to do that? Or any other suggestions about measuring
>force?
>Thanks in advance.
>
>Sincerely,
>Li Li
>
>----------------------------
>Li Li
>Dept. of Mechanical Engineering
>University of Arkansas
>Fayetteville, AR 72701
>Tel: 501-521-9890
>Fax: 501-575-6982
>E-mail: [email protected]
>----------------------------
>
>
>
>
>
Wen H. Ko
Phone: 1-216-368-2071
FAX: 1-216-368-5326
e mail: [email protected]


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