Compensation structures can be added to the mask layout to decelerate the
faster etching planes [(411) as suggested by some authors] and prevent
corner undercutting. The dimensions of the compensation structure depend on
the concentration of etchant and some critical etch ratios. Some good
references for corner compensation schemes are:
1. Mayer et al, J.Electrochem. Soc.,(1990),137(12), 3947
2. Sandmaier et al, IEEE Transducers'91, (1991),456-459
3. Enoksson, J. Micromech. Microeng. (1997),7,141-144
Kunal Vaed
Passives Integration
Silicon Germanium Technology
IBM Microelectronics
Hopewell Junction, NY 12533