A MEMS Clearinghouse® and information portal
for the MEMS and Nanotechnology community
RegisterSign-In
MEMSnet Home About Us What is MEMS? Beginner's Guide Discussion Groups Advertise Here
News
MEMSnet Home: MEMS-Talk
..
  • Finding info on C.Hutchins & Associates ([email protected])
  • Thermal expasion coefficient for SiC (Hyun-soo Kim)
  • discrepancy between SSuprem4 and ASTM resistivity tables ([email protected])
  • Titanium in MEMS (Conor O'Mahony)
  • Quintel Q-4000 system: request for reviews (Vince Wilson)
  • Bulk Carrier Lifetime tester- Sinton (Kenneth Smith)
  • Control the pore size and layer thickness of porous silicon (Giuseppe Barillaro)
  • IDs? ([email protected])
  • Thermal expasion coefficient for SiC (Christopher F. Blanford)
  • Positive resists for MEMS processing ([email protected])
  • Positive resists for MEMS processing (C. Suzanne Miller)
  • Positive resists for MEMS processing (Rohit Srivastava)
  • Positive resists for MEMS processing (Jon Doe)
Events
Glossary
Materials
Links
MEMS-talk
Terms of Use | Contact Us | Search
MEMS Exchange
MEMS Industry Group
Coventor
Harrick Plasma
Tanner EDA
The Branford Group
University Wafer
Addison Engineering
MEMS Technology Review