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  • Deep trench doping n+ (motocycle)
  • Young modulus value of heavily-(p)doped Silicon (Liviu NICU)
  • Edges problem in through-mask NiFe electroplating (Magali Brunet)
  • Re: stiction of contacting surfaces (Atzmon Ofri)
  • SV: [mems-talk] Edges problem in through-mask NiFe electroplating (Frank Rasmussen)
  • Edges problem in through-mask NiFe electroplating (Justin Borski)
  • MEMS air flow devices (somerville j)
  • 3 D Lithography (Sonia Garcia Blanco)
  • Edges problem in through-mask NiFe electroplating (Mike Mattes)
  • Young modulus value of heavily-(p)doped Silicon ([email protected])
  • Deep trench doping n+ (bille@npphotonics (Bill Eaton))
  • 3 D Lithography (Rob Hardman)
  • submit an abstract ! (Christophe Gorecki)
  • "pull-in" data for circular plates (samir)
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