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Au film (Y.Yang)
TiO2 refraction index (
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Photlith on transparent materials (Borski, Justin)
[ADMIN] Vacation messages (
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Re: SU8 Adhesion to Si (Greg Reimann)
refraction index of LPCVD silicon dioxide (Glenn Silveira)
PDMS glass bonding with allignment (varun reddy)
50 +/- 5 micron through hole in Pyrex wafer (Patrick Roman)
refraction index of LPCVD silicon dioxide (Feridun Ay)
Re: SU8 Adhesion to Si (Brubaker Chad)
Re: SU8 Adhesion to Si (Gabriel Dagani)
PDMS glass bonding with allignment (Z.,W.Y.(Lydia))
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