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  • References for functionalization of PDMS (Nikhil Modi)
  • Max. thickness of Cr layer (Kirt Williams)
  • Measurment device for transistor characteristic (Ho Yin Chan)
  • testing of a diaphragm (Shay Kaplan)
  • Measurment device for transistor characteristic (Torsten Wagner)
  • Measurment device for transistor characteristic (Shay Kaplan)
  • Quartz Crystal Fixture (erkin seker)
  • Re: Argument in CD writing process (Ho Yin Chan)
  • Platinised Platinum (Ali Mansouri)
  • References for functionalization of PDMS (Nikhil Modi)
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Harrick Plasma
Tanner EDA
Tanner EDA by Mentor Graphics
The Branford Group
Nano-Master, Inc.
Process Variations in Microsystems Manufacturing